Laser Diffraction Process and Apparatus For Width Measurement Of Elongated Objects
Patent #: 7,072,051
Inventor(s): Amir Naqwi and Christopher Fandrey
Company: Powerscope Incorporated
An apparatus for detecting a width of an elongated object was recently issued a patent. The apparatus comprises a radiation source for emitting a beam of radiation relative to an axis and a sensor region for receiving elongated objects, which is arranged relative to the beam so that the objects scatter radiation in a forward direction. Also included is a scatter detector with a plurality of radiation detectors responsive to impinging radiation intensity to provide a signal representative of impinging radiation intensity. Each radiation detector has a respective radial width and the radiation detectors are arranged relative to the axis by width. A radiation receiving system is positioned relative to the sensor region to transform radiation scattered by the objects to locations on the scatter detector based on the scatter angles of the scattered radiation.
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