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  • Quality Control & Inspection Systems Update

    Quality Control & Inspection Systems Update

    Karen Bitz McIntyre, Editor || February 15, 2012
    A look at how quality control and inspection systems are helping move nonwovens and disposable products forward

  • Cognex Promotes Willett

    February 1, 2010
    Cognex Corp. has promoted Robert Willett to president and COO. Mr. Willett will assume these responsibilities in addition to his current role as president for the Modular Vision Systems, which is the largest operating division of Cognex. As presiden…

  • Cognex Enters Web Monitoring

    October 8, 2009
    Acquisition will complement current offerings.

  • Cognex Corporation has named Tom Nash president of the Surface Inspection Systems division

    January 1, 2009
    Cognex Corporation has named Tom Nash president of the Surface Inspection Systems division. Mr. Nash reports to Robert Shillman, chairman and CEO of Cognex. Cognex’s Surface Inspection Systems division specializes in developing turnkey vision syste…

  • Cognex Names Surface Inspection Head

    November 20, 2008
    Tom Nash to succeed Markku Jaaselainen as president.

  • Cognex Fights Patent Claims

    March 21, 2006
    Cognex Corporation, a supplier of machine vision systems, has served a complaint against Acacia Research Corporation and Veritec, Inc.  The complaint was filed in the U.S. District Court in Minnesota.     Cognex is seeking a decl…

  • President of its Modular Vision Systems Division

    November 30, -0001
    Cognex Corporation has hired Robert Willett as president of its Modular Vision Systems Division (MVSD). Mr. Willett will report to Cognex chairman and CEO Robert Shillman. As president of MVSD, Mr. Willett will oversee the largest operating divi…

  • Vision-Based Wafer Pre-Aligner

    November 30, -0001
    Cognex Corporation has introduced the In-Sight 1820 vision-based wafer pre-aligner. Utilizing proprietary Cognex NotchMaxTM alignment technology, the 1820 vision system provides precise non-contact measurement of wafer position and orientation that i…